Pougeoise, E., Gilet, P., Grosse, P., Poncet, S., Chelnokov, A., Gérard, J. M., Bourgeois, G., Stevens, R., Hamelin, R., Hammar, M., Berggren, J., Sundgren, P., Vilain, S., Bouillard, J. S., Lerondel, G., Bachelot, R., & Royer, P. Experimental characteristics and analysis of transverse modes in 1.3 μm strained InGaAs quantum well VCSELs