@article { , title = {Electron hopping rate measurements in ITO junctions: charge diffusion in a layer-by-layer deposited ruthenium(II)-bis(benzimidazolyl)pyridine-phosphonate- TiO2 film}, abstract = {Focused ion beam (FIB) machining allowed a sub-micron trench to be cut through tin-doped indium oxide (ITO) film on glass to give a generator - collector junction electrode with narrow gap (ca. 600 nm). A layer-by-layer deposited film composed of a dinuclear ruthenium(II)-bis(benzimidazolyl) pyridine-phosphonate (as the negative component) and nanoparticulate TiO2 (ca. 6 nm diameter, as the positive component) was formed and investigated first on simple ITO electrodes and then on ITO junction electrodes. The charge transport within this film due to Ru(II/III) redox switching (electron hopping) was investigated and an apparent diffusion coefficient of ca. Dapp = 2 (\} 1) 1015 m2 s1 was observed with minimal contributions from intra-molecular Ru-Ru interactions. The benefits of FIB-cut ITO junctions as a tool in determining charge hopping rates are highlighted.}, doi = {10.1016/j.jelechem.2011.04.010}, issn = {1572-6657}, issue = {1-2}, journal = {JOURNAL OF ELECTROANALYTICAL CHEMISTRY}, note = {Batch 004. Output ID 28637.}, pages = {196-201}, publicationstatus = {Published}, publisher = {Elsevier}, url = {https://hull-repository.worktribe.com/output/400072}, volume = {657}, keyword = {Specialist Research - Other, Voltammetry, Layer-by-layer assembly, Electron hopping, Diffusion, Focused ion beam, Sensor}, year = {2011}, author = {Dale, Sara E C and Haga, Masa-aki and Dale, Sara E. C. and Wadhawan, Jay and Cummings, Charles Y. and Wadhawan, Jay D. and Nakabayashi, Takuya and Haga, Masa Aki and Rassaei, Liza and Dale, Sara E.C. and Bending, Simon and Pumera, Martin and Parker, Stephen C. and Marken, Frank} }