Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor
(2009)
Journal Article
Dröge, S., Khalifah, M. S. A., O'Neill, M., Thomas, H. E., Simmonds, H. S., Macdonald, J. E., …Kelly, S. M. (2009). Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor. Journal of Physical Chemistry B, 113(1), 49-53. https://doi.org/10.1021/jp803379a
Grazing incidence X-ray diffraction is used to find the thin film morphology of an extended molecule with an irregular alternating fluorene - thiophene structure, which is used to obtain linearly polarized electroluminescence and the photovoltaic eff... Read More about Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor.