Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor
(2009)
Journal Article
Dröge, S., Khalifah, M. S. A., O'Neill, M., Thomas, H. E., Simmonds, H. S., Macdonald, J. E., Aldred, M. P., Vlachos, P., Kitney, S. P., Löbbert, A., & Kelly, S. M. (2009). Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor. Journal of Physical Chemistry B, 113(1), 49-53. https://doi.org/10.1021/jp803379a
Grazing incidence X-ray diffraction is used to find the thin film morphology of an extended molecule with an irregular alternating fluorene - thiophene structure, which is used to obtain linearly polarized electroluminescence and the photovoltaic eff... Read More about Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor.