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A Survey of the methods on fingerprint orientation field estimation

Bian, Weixin; Xu, Deqin; Li, Qingde; Cheng, Yongqiang; Jie, Biao; Ding, Xintao


Weixin Bian

Deqin Xu

Yongqiang Cheng

Biao Jie

Xintao Ding


Fingerprint orientation field (FOF) estimation plays a key role in enhancing the performance of the automated fingerprint identification system (AFIS): Accurate estimation of FOF can evidently improve the performance of AFIS. However, despite the enormous attention on the FOF estimation research in the past decades, the accurate estimation of FOFs, especially for poor-quality fingerprints, still remains a challenging task. In this paper, we devote to review and categorization of the large number of FOF estimation methods proposed in the specialized literature, with particular attention to the most recent work in this area. Broadly speaking, the existing FOF estimation methods can be grouped into three categories: gradient-based methods, mathematical models-based methods, and learning-based methods. Identifying and explaining the advantages and limitations of these FOF estimation methods is of fundamental importance for fingerprint identification, because only a full understanding of the nature of these methods can shed light on the most essential issues for FOF estimation. In this paper, we make a comprehensive discussion and analysis of these methods concerning their advantages and limitations. We have also conducted experiments using publically available competition dataset to effectively compare the performance of the most relevant algorithms and methods.


Bian, W., Xu, D., Li, Q., Cheng, Y., Jie, B., & Ding, X. (2019). A Survey of the methods on fingerprint orientation field estimation. IEEE Access, 7, 32644-32663.

Journal Article Type Article
Acceptance Date Mar 4, 2019
Online Publication Date Mar 26, 2019
Publication Date 2019
Deposit Date Jun 14, 2019
Publicly Available Date Jun 14, 2019
Journal IEEE Access
Electronic ISSN 2169-3536
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 7
Pages 32644-32663
Keywords General Engineering; General Materials Science; General Computer Science
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