Outputs (3)

Rod-shaped dopants for flexoelectric nematic mixtures (2009)
Journal Article
Aziz, N., Kelly, S. M., Duffy, W., & Goulding, M. (2009). Rod-shaped dopants for flexoelectric nematic mixtures. Liquid crystals, 36(5), 503-520. https://doi.org/10.1080/02678290903031643

We report the synthesis and liquid crystalline behaviour of two series of para-substituted terphenyls as dopants with a rigid rod-like shape, rather than a wedge-, pear- or banana-shape, for guest-host nematic mixtures with flexoelectric properties.... Read More about Rod-shaped dopants for flexoelectric nematic mixtures.

Electrochemical Determination of Diffusion Anisotropy in Molecularly-Structured Materials (2009)
Journal Article
Evans, L. A., Thomasson, M. J., Kelly, S. M., & Wadhawan, J. (2009). Electrochemical Determination of Diffusion Anisotropy in Molecularly-Structured Materials. Journal of physical chemistry. C, 113(20), 8901-8910. https://doi.org/10.1021/jp806322c

Theory is presented for the case of two-dimensional diffusion anisotropy in axiosymmetric systems, which, advantageously and indirectly, affords a unified theory of diffusive mass transport at planar, microdisk (or nanodisk) and cylindrical electrode... Read More about Electrochemical Determination of Diffusion Anisotropy in Molecularly-Structured Materials.

Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor (2009)
Journal Article
Dröge, S., Khalifah, M. S. A., O'Neill, M., Thomas, H. E., Simmonds, H. S., Macdonald, J. E., Aldred, M. P., Vlachos, P., Kitney, S. P., Löbbert, A., & Kelly, S. M. (2009). Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor. Journal of Physical Chemistry B, 113(1), 49-53. https://doi.org/10.1021/jp803379a

Grazing incidence X-ray diffraction is used to find the thin film morphology of an extended molecule with an irregular alternating fluorene - thiophene structure, which is used to obtain linearly polarized electroluminescence and the photovoltaic eff... Read More about Grazing incidence X-ray diffraction of a photoaligned nematic semiconductor.