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Laser induced magnetization reversal for detection in optical interconnects

Azim, Zubair Al; Fong, Xuanyao; Ostler, Thomas; Chantrell, Roy; Roy, Kaushik

Authors

Zubair Al Azim

Xuanyao Fong

Thomas Ostler

Roy Chantrell

Kaushik Roy



Abstract

Optical interconnect has emerged as the front-runner to replace electrical interconnect especially for off-chip communication. However, a major drawback with optical interconnects is the need for photodetectors and amplifiers at the receiver, implemented usually by direct bandgap semiconductors and analog CMOS circuits, leading to large energy consumption and slow operating time. In this letter, we propose a new optical interconnect architecture that uses a magnetic tunnel junction (MTJ) at the receiver side that is switched by femtosecond laser pulses. The state of the MTJ can be sensed using simple digital CMOS latches, resulting in significant improvement in energy consumption. Moreover, magnetization in the MTJ can be switched on the picoseconds time-scale and our design can operate at a speed of 5 Gb/s for a single link.

Citation

Azim, Z. A., Fong, X., Ostler, T., Chantrell, R., & Roy, K. (2014). Laser induced magnetization reversal for detection in optical interconnects. IEEE Electron Device Letters, 35(12), 1317-1319. https://doi.org/10.1109/LED.2014.2364232

Journal Article Type Article
Acceptance Date Oct 17, 2014
Online Publication Date Oct 27, 2014
Publication Date 2014-12
Deposit Date Jun 15, 2022
Journal IEEE Electron Device Letters
Print ISSN 0741-3106
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 35
Issue 12
Pages 1317-1319
DOI https://doi.org/10.1109/LED.2014.2364232
Public URL https://hull-repository.worktribe.com/output/4014609