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The stability of PEDOT:PSS films monitored by electron spin resonance

Kemp, Neil; Lee, J. K.; Cho, J. M.; Shin, W. S.; Moon, S. J.; Kemp, N. T.; Zhang, H.; Lamb, R.


Neil Kemp

J. K. Lee

J. M. Cho

W. S. Shin

S. J. Moon

N. T. Kemp

H. Zhang

R. Lamb


We used electron spin resonance (ESR) and electrical conductivity measurements to track the stability of poly(3,4-ethylene dioxythiophene): poly(styrene sulfonate) (PEDOT:PSS) and ethylene glycol (EG)-treated PEDOT:PSS (EG-PEDOT:PSS) films in air. We observed that the ESR intensity of the PEDOT:PSS films decreased in air with oxidation, along with the conductivity. The rate of decrease depended on the thickness of the film. The EG-treated PEDOT:PSS films showed better stability for both the DC conductivity and the ESR intensity compared with untreated PEDOT:PSS films. PEDOT:PSS, oxidized-PEDOT:PSS, and EG-PEDOT:PSS, all showed a symmetric ESR line shape with the same g-value (g = 2.0037), indicative of polarons as the origin of paramagnetic spin resonance. Low-temperature (100 - 300 K) ESR measurements showed a temperature-independent spin density for all types of samples, in agreement with the metallic phases. The linear temperature-dependent increase of the resonance line width (ΔH pp ) was mostly ascribable to carrier hopping.


Lee, J. K., Cho, J. M., Shin, W. S., Moon, S. J., Kemp, N. T., Zhang, H., & Lamb, R. (2008). The stability of PEDOT:PSS films monitored by electron spin resonance. Journal of the Korean Physical Society, 52(3), 621-626.

Journal Article Type Article
Acceptance Date Mar 31, 2008
Publication Date Mar 15, 2008
Print ISSN 0374-4884
Publisher Springer Verlag
Peer Reviewed Peer Reviewed
Volume 52
Issue 3
Pages 621-626
Keywords General Physics and Astronomy
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