Automated model generation algorithm for high-level fault modeling

Xia, Likun; Wilkinson, Antony J.; Bell, Ian M.

Abstract

High-level modeling for operational amplifiers (opamps) has been previously carried out successfully using models generated by published automated model generation approaches. Furthermore, high-level fault modeling (HLFM) has been shown to work reasonably well using manually designed fault models. However, no evidence shows that published automated model generation approaches based on opamps have been used in HLFM. This paper describes HLFM for analog circuits using an adaptive self-tuning algorithm called multiple model generation system using delta. The generation algorithms and simulation models were written in MATLAB and the hardware description language VHDL-AMS, respectively. The properties of these self-tuning algorithms were investigated by modeling complementary metal-oxide-semiconductor opamps, and comparing simulations using the HLFM against those of the original simulation program with integrated circuit emphasis circuit utilizing transient analysis. Results show that the models can handle both linear and nonlinear fault situations with better accuracy than previously published HLFMs. © 2006 IEEE.

Citation

Xia, L., Wilkinson, A. J., & Bell, I. M. (2010). Automated model generation algorithm for high-level fault modeling. IEEE transactions on computer-aided design of integrated circuits and systems, 29(7), 1140-1145. https://doi.org/10.1109/TCAD.2010.2045556

• Journal Article Type: Article
• Acceptance Date: Jul 31, 2010
• Publication Date: Jul 1, 2010
• Journal: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
• Print ISSN: 0278-0070
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 29
• Issue: 7
• Pages: 1140-1145
• DOI: https://doi.org/10.1109/TCAD.2010.2045556
• Keywords: Electrical and Electronic Engineering; Software; Computer Graphics and Computer-Aided Design
• Public URL: https://hull-repository.worktribe.com/output/417759
• Publisher URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5487470