Review of high level fault modeling approaches for mixed-signal systems
Xia, Likun; Wilkinson, Antony; Bell, Ian
In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the importantpart since every fault in the whole circuit has to be simulated at that level. Unfortunately, it isa very CPU intensive task even though it maintains the high accuracy. Therefore, High Level FaultModeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the effortsof simulation. In this paper, different HLFM approaches are reviewed at the device level during last twodecades. We clarify their domains of application and evaluate their strengths and current limitations.We also analyze causes of faults and introduce various test approaches.
Xia, L., Wilkinson, A., & Bell, I. (2010). Review of high level fault modeling approaches for mixed-signal systems. Journal of Electronics (China), 27(4), 490-497. https://doi.org/10.1007/s11767-011-0350-1
|Journal Article Type||Article|
|Online Publication Date||Mar 11, 2011|
|Journal||Journal of Electronics|
|Peer Reviewed||Peer Reviewed|
|Keywords||High Level Fault Modeling (HLFM); Automated Model Generation (AMG)|
This file is under embargo due to copyright reasons.
You might also like
The 'mouse organ' project: A learning approach to promote creativity and motivation
Discretization effects in TLM diffusion models
POSSUM and P-POSSUM in the comparative audit of patients undergoing carotid endarterectomy