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Review of high level fault modeling approaches for mixed-signal systems

Xia, Likun; Wilkinson, Antony; Bell, Ian

Authors

Likun Xia

Dr Antony Wilkinson A.J.Wilkinson@hull.ac.uk
Lecturer/ Programme Director for Electronic, and Electrical & Electronic Engineering Programmes

Ian Bell I.M.Bell@hull.ac.uk



Abstract

In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the importantpart since every fault in the whole circuit has to be simulated at that level. Unfortunately, it isa very CPU intensive task even though it maintains the high accuracy. Therefore, High Level FaultModeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the effortsof simulation. In this paper, different HLFM approaches are reviewed at the device level during last twodecades. We clarify their domains of application and evaluate their strengths and current limitations.We also analyze causes of faults and introduce various test approaches.

Journal Article Type Article
Publication Date 2010-07
Journal Journal of Electronics
Print ISSN 0217-9822
Electronic ISSN 1993-0615
Publisher Springer Verlag
Peer Reviewed Peer Reviewed
Volume 27
Issue 4
Pages 490-497
APA6 Citation Xia, L., Wilkinson, A., & Bell, I. (2010). Review of high level fault modeling approaches for mixed-signal systems. Journal of Electronics (China), 27(4), (490-497). doi:10.1007/s11767-011-0350-1. ISSN 0217-9822
DOI https://doi.org/10.1007/s11767-011-0350-1
Keywords High Level Fault Modeling (HLFM); Automated Model Generation (AMG)
Publisher URL http://link.springer.com/article/10.1007/s11767-011-0350-1
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