Review of high level fault modeling approaches for mixed-signal systems

Xia, Likun; Wilkinson, Antony; Bell, Ian

Abstract

In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the importantpart since every fault in the whole circuit has to be simulated at that level. Unfortunately, it isa very CPU intensive task even though it maintains the high accuracy. Therefore, High Level FaultModeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the effortsof simulation. In this paper, different HLFM approaches are reviewed at the device level during last twodecades. We clarify their domains of application and evaluate their strengths and current limitations.We also analyze causes of faults and introduce various test approaches.

Citation

Xia, L., Wilkinson, A., & Bell, I. (2010). Review of high level fault modeling approaches for mixed-signal systems. Journal of Electronics (China), 27(4), (490-497). doi:10.1007/s11767-011-0350-1. ISSN 0217-9822

• Journal Article Type: Article
• Online Publication Date: Mar 11, 2011
• Publication Date: 2010-07
• Journal: Journal of Electronics
• Print ISSN: 0217-9822
• Electronic ISSN: 1993-0615
• Publisher: Springer Verlag
• Peer Reviewed: Peer Reviewed
• Volume: 27
• Issue: 4
• Pages: 490-497
• DOI: https://doi.org/10.1007/s11767-011-0350-1
• Keywords: High Level Fault Modeling (HLFM); Automated Model Generation (AMG)
• Public URL: https://hull-repository.worktribe.com/output/417760
• Publisher URL: http://link.springer.com/article/10.1007/s11767-011-0350-1