Assessment of microfluidic system testability using fault simulation and test metrics

Myers, Thomas O.; Bell, Ian; Bell, Ian M.

Abstract

In this paper we introduce a Microfluidic Fault Simulator, MFS, which uses a novel method of fault modeling and injection, the Fault Block, a generic and low abstraction fault modeling technique. This technique has been utilized over a wide range of fault conditions, in this paper we present a trapped bubble condition. In conjunction with injecting fault conditions, we can apply test methods. Two methods proving sensitive to microfluidic faults are; impedance spectroscopy and Levich electro-chemical sensors, illustrated here by a diffusional "Y" channel mixing system case study. Data from the MFS is analyzed using a Neyman-Pearson probabilistic approach, providing information on each sensor's test capability. Overall fault coverage for a given test is determined. This approach allows the analysis of fault coverage offered by functional-test orientated sensors to be compared to alternative approaches, which potentially offer increased coverage at lower cost.

Citation

Myers, T. O., & Bell, I. M. (2011). Assessment of microfluidic system testability using fault simulation and test metrics. Journal of electronic testing : theory and applications : (JETTA), 27(3), 363-373. https://doi.org/10.1007/s10836-011-5202-2

• Journal Article Type: Article
• Acceptance Date: Jan 25, 2011
• Online Publication Date: Feb 22, 2011
• Publication Date: 2011-06
• Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
• Print ISSN: 0923-8174
• Publisher: Springer Verlag
• Peer Reviewed: Peer Reviewed
• Volume: 27
• Issue: 3
• Pages: 363-373
• DOI: https://doi.org/10.1007/s10836-011-5202-2
• Keywords: Heterogeneous system simulation; Microfluidic test; Fault analysis; Impedance spectroscopy; Fault injection; Fault modeling
• Public URL: https://hull-repository.worktribe.com/output/417758
• Publisher URL: http://www.springerlink.com/content/n450026328n72073/