Thomas O. Myers
Assessment of microfluidic system testability using fault simulation and test metrics
Myers, Thomas O.; Bell, Ian; Bell, Ian M.
Ian Bell I.M.Bell@hull.ac.uk
Ian M. Bell
In this paper we introduce a Microfluidic Fault Simulator, MFS, which uses a novel method of fault modeling and injection, the Fault Block, a generic and low abstraction fault modeling technique. This technique has been utilized over a wide range of fault conditions, in this paper we present a trapped bubble condition. In conjunction with injecting fault conditions, we can apply test methods. Two methods proving sensitive to microfluidic faults are; impedance spectroscopy and Levich electro-chemical sensors, illustrated here by a diffusional "Y" channel mixing system case study. Data from the MFS is analyzed using a Neyman-Pearson probabilistic approach, providing information on each sensor's test capability. Overall fault coverage for a given test is determined. This approach allows the analysis of fault coverage offered by functional-test orientated sensors to be compared to alternative approaches, which potentially offer increased coverage at lower cost.
|Journal Article Type||Article|
|Journal||JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS|
|Peer Reviewed||Peer Reviewed|
|APA6 Citation||Myers, T. O., & Bell, I. M. (2011). Assessment of microfluidic system testability using fault simulation and test metrics. Journal of electronic testing : theory and applications : (JETTA), 27(3), (363-373). doi:10.1007/s10836-011-5202-2. ISSN 0923-8174|
|Keywords||Heterogeneous system simulation; Microfluidic test; Fault analysis; Impedance spectroscopy; Fault injection; Fault modeling|
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